oloa

SiC Substrate

fa'amatalaga puupuu:

maualuga lamolemole
2. Lattice maualuga fa'afetaui (MCT)
3.Low dislocation density
4. High transmittance infrared


Fa'amatalaga Oloa

Faailoga o oloa

Fa'amatalaga

Silicon carbide (SiC) o se tuufaatasiga binary o le Vaega IV-IV, na o le pau lea o le faʻamautu mautu i le Vaega IV o le Vaitaimi Vaitaimi, O se semiconductor taua.O le SiC e sili ona lelei le vevela, masini, vailaʻau ma eletise, lea e avea ai ma se tasi o mea sili ona lelei mo le faʻaogaina o le vevela, maualuga, ma le maualuga o le eletise eletise, o le SiC e mafai foi ona faʻaaogaina e fai ma mea faʻapipiʻi. mo GaN fa'avae moli moli-emitting diodes.I le taimi nei, 4H-SiC o le oloa autu i le maketi, ma o le conductivity ituaiga e vaevaeina i semi-insulating ituaiga ma N ituaiga.

Meatotino

Aitema

2 inisi 4H N-ituaiga

Diamita

2 inisi (50.8mm)

mafiafia

350+/-25um

Fa'atonuga

ese axis 4.0˚ agai i <1120> ± 0.5˚

Primary Flat Orientation

<1-100> ± 5°

Lua Flat
Fa'atonuga

90.0˚ CW mai le Primary Flat ± 5.0˚, Si Fa'asaga i luga

Primary Flat Umi

16 ± 2.0

Lua Mafolafola Umi

8 ± 2.0

Vasega

Vasega o gaosiga (P)

Vasega su'esu'e (R)

Vasega fa'alelei (D)

Tete'e

0.015~0.028 Ω·cm

<0.1 Ω·cm

<0.1 Ω·cm

Micropipe Density

≤ 1 paipa micro/cm²

≤ 1 0micropipes/ cm²

≤ 30 micropipe/cm²

Fa'asaa o luga

Si fa'asaga CMP Ra <0.5nm, C Fa'asaga Ra <1 nm

N/A, vaega fa'aoga > 75%

TTV

<8 um

<10um

<15 um

punou

< ±8 um

< ±10um

< ±15um

A'ai

<15 um

<20 um

<25 um

Ta'eta'ei

Leai

Umi fa'aputu ≤ 3 mm
i luga o le pito

umi fa'aopoopo ≤10mm,
nofofua
umi ≤ 2mm

Masisi

≤ 3 maosiosi, fa'aputu
umi <1* lautele

≤ 5 matasi, fa'aputu
umi <2* lautele

≤ 10 matasi, fa'aputu
umi <5* lautele

Papatusi Hex

aupito maualuga 6 ipu,
<100um

aupito maualuga 12 ipu,
<300um

N/A, vaega fa'aoga > 75%

Polytype Areas

Leai

Vaega fa'aopoopo ≤ 5%

Vaega fa'aopoopo ≤ 10%

Fa'aleagaina

Leai

 


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